Imaging the surface in atomic resolution

Core competence Analysis of materials and surfaces
Method SPM
Contact person
Szakmai leírás

Scanning Probe Microscopy (SPM) is a group of methods, like Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM), that uses a probe to sense a probe to surface atom interaction. By two dimensional scanning of the probe on the surface in Ultra High Vacuum (UHV) condition reveals atomic resolution microscopic image.


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